Semiconductor device manufacturing: process – Gettering of substrate – By implanting or irradiating
Reexamination Certificate
2007-01-10
2010-11-16
Nguyen, Khiem D (Department: 2823)
Semiconductor device manufacturing: process
Gettering of substrate
By implanting or irradiating
C438S475000, C438S788000, C438S798000, C257SE29111
Reexamination Certificate
active
07833882
ABSTRACT:
A method of producing a semiconductor device, including: a first plasma processing step of processing a surface of a resin layer laid on a semiconductor element and containing silicon, with a first plasma generated from a gas containing oxygen and fluorine, thereby forming an oxide film; and an electrode pad forming step of forming an electrode pad of a metal on the oxide film.
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Office Action from Japanese Patent Office for Patent Application No. P2006-037134 mailed Mar. 2, 2010. English Translation Enclosed.
Nomaguchi Toshio
Tsuji Yukihiro
Nguyen Khiem D
Parendo Kevin
Smith , Gambrell & Russell, LLP
Sumitomo Electric Industries Ltd.
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