Metal working – Method of mechanical manufacture – Electrical device making
Reexamination Certificate
2007-02-05
2009-11-24
Arbes, C. J (Department: 3729)
Metal working
Method of mechanical manufacture
Electrical device making
C029S846000, C029S874000, C029S876000, C029S879000
Reexamination Certificate
active
07621045
ABSTRACT:
A probe is disclosed, comprising a beam4B, which has a front end4b1, an intermediate portion4b2and a base end4b3, the front end being a portion for contacting a test subject through a contactor, the base end being a portion for fixing the probe; and a substantially trapezoidal contactor4A, which is fixed to the leading end4b1of the beam.
REFERENCES:
patent: 4755747 (1988-07-01), Sato
patent: 5116462 (1992-05-01), Bartha et al.
patent: 5518964 (1996-05-01), DiStefano et al.
patent: 5634586 (1997-06-01), Kimura et al.
patent: 6014032 (2000-01-01), Maddix et al.
patent: 6059982 (2000-05-01), Palagonia et al.
patent: 6091124 (2000-07-01), Bayer et al.
patent: 6232143 (2001-05-01), Maddix et al.
patent: 6256882 (2001-07-01), Gleason et al.
patent: 6307392 (2001-10-01), Soejima et al.
patent: 6328902 (2001-12-01), Hantschel et al.
patent: 6358426 (2002-03-01), Muramatsu et al.
patent: 6482013 (2002-11-01), Eldridge et al.
patent: 6578264 (2003-06-01), Gleason et al.
patent: 6690186 (2004-02-01), Fjelstad
patent: 6713374 (2004-03-01), Eldridge et al.
patent: 6933738 (2005-08-01), Martin et al.
patent: 7073254 (2006-07-01), Eldridge et al.
patent: 2001/0009376 (2001-07-01), Takekoshi et al.
patent: 2003/0030455 (2003-02-01), Tanioka et al.
patent: 230 348 (1987-07-01), None
patent: 4-340733 (1992-11-01), None
patent: 10-19991 (1998-01-01), None
patent: 2000-121673 (2000-04-01), None
patent: 2000-227444 (2000-08-01), None
patent: 2000-241457 (2000-09-01), None
patent: 2001-165956 (2001-06-01), None
patent: 2001-281268 (2001-10-01), None
patent: 96/37332 (1996-11-01), None
IBM Technical Disclosure Bulletin, Gladstein et al., vol. 22, No. 7, p. 2824 Dec. 1979.
Hosaka Hisatomi
Takekoshi Kiyoshi
Arbes C. J
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Tokyo Electron Limited
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