Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-09-08
2011-11-08
Bui, Bryan (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
08055464
ABSTRACT:
The method of processing waveform data from one or more channels using a test and measurement instrument, such as an oscilloscope, is described in which waveform data is collected from a DUT; defining a context is defined by instructing the instrument to obtain the focus of each waveform datum having a first user-defined attribute; defining a selection criteria by instructing the instrument to obtain the focus of each waveform datum having both a first user-defined attribute and a second user-defined attribute; and defining an action by instructing the instrument to perform an operation responsive to finding at least one waveform datum having both the first user-defined attribute and the second user-defined attribute.
REFERENCES:
patent: 6707474 (2004-03-01), Beck et al.
patent: 7315791 (2008-01-01), Ilic et al.
patent: 2002/0147554 (2002-10-01), Pickerd
Robinson Tristan A.
Rule Keith D.
Sedeh Mehrab
Twete Robert D.
Bui Bryan
Gray Francis I.
Langlotz Patent Works Inc.
Lenihan Thomas F.
Tektronix Inc.
LandOfFree
Method of processing waveform data from one or more channels... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of processing waveform data from one or more channels..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of processing waveform data from one or more channels... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4263218