Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
Patent
1998-05-20
2000-11-28
Hoff, Marc S.
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Mechanical measurement system
702155, 356318, 356320, 600408, G01J 300
Patent
active
061547085
ABSTRACT:
The present method of processing spectral data calculates the first to fourth derivative spectra of an original spectrum with respect to the wavenumber and creates a two-dimensional representation by plotting coordinates consisting of the derivative values of some order as their abscissas and the original spectral values or derivative values of another order different from that order as their ordinates. In this two-dimensional plotting, maximal points, minimal points, maximal slope points (inflection points) and the like are clearly represented, so that a great amount of accurate feature information about the analyzed object can be easily obtained.
REFERENCES:
patent: 4975862 (1990-12-01), Keller et al.
patent: 5124932 (1992-06-01), Lodder
patent: 5379238 (1995-01-01), Stark
patent: 5660181 (1997-08-01), Ho et al.
patent: 5813987 (1998-09-01), Modell et al.
patent: 5828452 (1998-10-01), Gillispie et al.
Bui Bryan
Hoff Marc S.
Kurashiki Boseki Kabushiki Kaisha
LandOfFree
Method of processing and correcting spectral data in two-dimensi does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of processing and correcting spectral data in two-dimensi, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of processing and correcting spectral data in two-dimensi will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1734921