Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Patent
1975-04-21
1976-12-14
Schmidt, William H.
Coating processes
Measuring, testing, or indicating
Thickness or uniformity of thickness determined
350 96WG, 427162, 427163, 427164, 427250, 427255, 427343, 427374R, 427377, 427380, 427399, 427430R, G02B 514, B05D 506, C23C 1302, B05D 302
Patent
active
039976874
ABSTRACT:
A single crystal of lithium tantalate is pretreated to diffuse lithium atoms into the crystal. Niobium is then diffused into the pretreated crystal to form an optical waveguide.
REFERENCES:
patent: 3837827 (1974-09-01), Corruthers et al.
Hammer et al., "Low Loss Single Mode Optical Waveguide" in Applied Physics Letters, vol. 24, pp. 545-547, June 1, 1974.
Tien et al., "Optical Waveguide Modes in Single-Crystalline LiNbO.sub.3 -LiTaO.sub.3 Solid-Solution Films," Applied Physics Letters, vol. 24, pp. 503-506, May, 1974.
Minakata et al., "L.Nb.sub.x Ta.sub.l.sub.-Y O.sub.3 Optical Waveguiding Layer in LiTaO.sub.3." Applied Physics Letters vol. 26, pp. 395-398, Apr. 1, 1975.
Standley et al., "Nb-diffused LitaO.sub.3 Optical Waveguides." Applied Physics Letters, vol. 25, pp. 711-713, Dec., 1974.
Bruestle Glenn H.
Harcarik Joseph T.
Morris Birgit E.
RCA Corporation
Schmidt William H.
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