Abrading – Precision device or process - or with condition responsive... – Computer controlled
Reexamination Certificate
2005-09-06
2005-09-06
Hail, III, Joseph J. (Department: 3723)
Abrading
Precision device or process - or with condition responsive...
Computer controlled
C451S008000, C451S009000, C451S010000, C451S011000, C451S041000, C451S285000, C451S286000, C451S287000, C451S288000, C451S364000
Reexamination Certificate
active
06939200
ABSTRACT:
A method of predicting the lapping property of a charged lapping plate uses samples with a known lap surface. The samples are lapped on the plate and a non-invasive sensor is used to determine the lapping rate under a fixed load and rotation speed. The total frictional force of the samples is measured during the lapping to calculate the friction and Preston coefficients of the plate. The samples are held in place while the plate rotates and the sensor measures the distance to the plate. The plate rotates for a specific time so that adequate removal of the pad material has occurred. The lapping rate is determined from a change in the gap distance over a time interval. The lapping rate and friction are then assessed to determine if the plate is lapping worthy.
REFERENCES:
patent: 4910155 (1990-03-01), Cote et al.
patent: 5738562 (1998-04-01), Doan et al.
patent: 5743784 (1998-04-01), Birang et al.
patent: 5948205 (1999-09-01), Kodera et al.
patent: 5985093 (1999-11-01), Chen
patent: 6074283 (2000-06-01), Maeda et al.
patent: 6095908 (2000-08-01), Torii
patent: 6217412 (2001-04-01), Campbell et al.
patent: 6257953 (2001-07-01), Gitis et al.
patent: 6293139 (2001-09-01), Keller et al.
patent: 6347975 (2002-02-01), Ishizaki et al.
patent: 6374479 (2002-04-01), Sasaki et al.
patent: 6395634 (2002-05-01), Miyamoto
patent: 6439964 (2002-08-01), Prahbu et al.
patent: 6494765 (2002-12-01), Gitis et al.
patent: 6531399 (2003-03-01), Kojima et al.
patent: 6594542 (2003-07-01), Williams
patent: 6736992 (2004-05-01), Zhang et al.
patent: 6739947 (2004-05-01), Molnar
patent: 2001/0007809 (2001-07-01), Mitsuhashi
patent: 2002/0052166 (2002-05-01), Kojima et al.
patent: 2002/0106971 (2002-08-01), Rodriquez et al.
patent: 58192747 (1983-11-01), None
patent: 61025766 (1986-02-01), None
patent: 1045568 (1989-02-01), None
patent: 2001030157 (2001-02-01), None
patent: 2003071708 (2003-03-01), None
Beaucage Jacey Robert
Goddu Paul Arthur
Tzeng Huey-Ming
Bracewell & Giuliani LLP
Hail III Joseph J.
Hitachi Global Storage Technologies - Netherlands B.V.
McDonald Shantese L.
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