Method of polishing or planarizing a substrate

Compositions – Etching or brightening compositions

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S691000

Reexamination Certificate

active

06872328

ABSTRACT:
A method of polishing or planarizing a substrate comprising abrading at least a portion of the surface of a substrate comprising a metal, metal oxide, metal composite, or mixture thereof, with a composition comprising a metal oxide abrasive and a liquid carrier, wherein the composition has a pH of about 7 or less and the metal oxide abrasive has a total surface hydroxyl group density no greater than about 3 hydroxyl groups per nm2.

REFERENCES:
patent: 4664679 (1987-05-01), Kohyama et al.
patent: 5114881 (1992-05-01), Kaneko et al.
patent: 5226930 (1993-07-01), Sasaki
patent: 5340370 (1994-08-01), Cadien et al.
patent: 5352277 (1994-10-01), Sasaki
patent: 5527423 (1996-06-01), Neville et al.
patent: 5664990 (1997-09-01), Adams et al.
patent: 5759917 (1998-06-01), Grover et al.
patent: 5767016 (1998-06-01), Muroyama
patent: 5895509 (1999-04-01), Ohmi et al.
patent: 5993686 (1999-11-01), Streinz et al.
patent: 6126853 (2000-10-01), Kaufman et al.
patent: 6136711 (2000-10-01), Grumbine et al.
patent: 6294105 (2001-09-01), Feeney et al.
patent: 6309560 (2001-10-01), Kaufman et al.
patent: 6316365 (2001-11-01), Wang et al.
patent: WO 9964527 (1999-12-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of polishing or planarizing a substrate does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of polishing or planarizing a substrate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of polishing or planarizing a substrate will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3416629

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.