Optics: measuring and testing – By polarized light examination
Reexamination Certificate
2005-08-23
2005-08-23
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By polarized light examination
C356S368000, C356S369000
Reexamination Certificate
active
06934023
ABSTRACT:
In order to obtain a simple and highly reliable method of polarimetry, there is provided a method of polarimetry characterized by calculating an angle of rotation from discrete 2 or 3 measuring points, and performing again the measurement on the measuring point which is not effective.
REFERENCES:
patent: 3312141 (1967-04-01), Cary
patent: 4988199 (1991-01-01), Paul
patent: 6036922 (2000-03-01), Kawamura et al.
patent: 6046804 (2000-04-01), Kawamura et al.
patent: 6137933 (2000-10-01), Hunter et al.
patent: 6166807 (2000-12-01), Kawamura et al.
patent: 6269203 (2001-07-01), Davies et al.
patent: 6297057 (2001-10-01), Kawamura et al.
patent: 6620622 (2003-09-01), Kawamura
patent: 0 805 352 (1997-11-01), None
patent: 1 065 497 (2001-01-01), None
patent: 63-012984 (1988-01-01), None
patent: 6-102175 (1994-04-01), None
patent: 6-324047 (1994-11-01), None
patent: 09-145605 (1997-06-01), None
patent: 2000-046730 (2000-02-01), None
patent: WO 02/067475 (2002-08-01), None
“Numerical Recipes in C” 1992, Cambridge University Press, Chapter 15, Modeling of Data, second edition, pp. 656-666.
Churin et al., “Passband flattening and broadening techniques for high spectral efficiency wavelength demultiplexers”, Electronic Letters, Jan. 7, 1999, vol. 35, No. 1.
International Search Report for PCT/EP02/09295.
Matsushita Electric - Industrial Co., Ltd.
Punnoose Roy M.
Toatley , Jr. Gregory J.
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