Coating processes – Measuring – testing – or indicating
Patent
1997-08-01
1999-05-18
Beck, Shrive
Coating processes
Measuring, testing, or indicating
427571, 427574, 427579, 4272553, 4272555, C23C16/40
Patent
active
059049529
ABSTRACT:
A method of depositing a hard silicon oxide based film is provided by controllably flowing a gas stream including an organosilicon compound into a plasma. The organosilicon compound is preferably combined with oxygen and helium and at least a portion of the plasma is preferably magnetically confined adjacent to a substrate during the depositing, most preferably by an unbalanced magnetron. These silicon oxide based films may be reproducibly deposited on small or large substrates with preselected properties.
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Felts John T.
Lopata Eugene S.
Beck Shrive
Draegert David A.
Meeks Timothy
Pace Salvatore P.
The BOC Group Inc.
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