Method of orienting an axis of magnetization of a first...

Details Method of orienting an axis of magnetization of a first... Method of orienting an axis of magnetization of a first...

2005-09-20

2005-09-20

LeDynh, Bot (Department: 2862)

Electricity: measuring and testing

Magnetic

Magnetometers

C324S249000

Reexamination Certificate

active

06946834

ABSTRACT:
A method of orienting the axis of magnetization of a first magnetic element with respect to a second magnetic element uses a first element and a second element lying on a substrate. Each of the elements has a magnetic layer with an axis of magnetization. The method includes depositing a pattern of flux-concentrating material close to the first element and subsequently orienting the axis of magnetization of the first element in an applied magnetic field. The semi-finished article for measuring a magnetic field includes a substrate, a first magnetic element, a second magnetic element, a third magnetic element and a fourth magnetic element on the substrate in a bridge configuration. A first bridge portion is provided wherein the first element and the second element are electrically connected in series. A second bridge portion is provided wherein the third element and the fourth element are electrically connected in series.

REFERENCES:
patent: 6636391 (2003-10-01), Watanabe et al.
patent: WO0010023 (1999-08-01), None
patent: WO0079298 (2000-06-01), None

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