Method of operating an ion trap mass spectrometer to determine t

Details Method of operating an ion trap mass spectrometer to determine t Method of operating an ion trap mass spectrometer to determine t

1991-01-25

1992-07-07

Berman, Jack I.

Radiant energy

Ionic separation or analysis

Methods

250291, 250292, 250293, H01J 4942, B01D 5944

Patent

active

051285428

ABSTRACT:
This invention relates generally to a method of operating an ion trap mass spectrometer to determine the resonant excitation frequencies of trapped ions. This can be achieved by: (1) introducing sample ions into the ion trap volume: (2) adjusting the trapping fields so that parent ions having a mass-to-charge ratio of interest which are to undergo collision induced dissociation (CID) are trapped; (3) applying an excitation voltage of predetermined frequency and amplitude across the end caps of the ion trap; (4) scanning the frequency of the excitation voltage in a first direction and monitoring for ejection of the parent ions; (5) repeating steps (1) through (3) and scanning the frequency of the excitation voltage in an opposite direction and monitoring for ejection of the parent ions; (6) averaging the frequencies at which the ions are ejected; and (7) applying that frequency in a subsequent MS/MS scan to promote CID of the parent ions to form daughter ions.

REFERENCES:
patent: 3527939 (1970-09-01), Dawson et al.
patent: 4540884 (1985-09-01), Stafford et al.
patent: 4736101 (1988-04-01), Syka et al.
patent: 4749860 (1988-06-01), Kelley et al.
patent: 5075547 (1991-12-01), Johnson et al.

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