Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2007-09-06
2010-12-28
Raevis, Robert R (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
Reexamination Certificate
active
07856866
ABSTRACT:
In a tapping mode Atomic Force Microscope (AFM) system, a probe is excited at an excitation frequency other than the probe's first natural frequency to produce a response signal manifesting a grazing bifurcation between “non-collision” and “collision” states of the AFM system, so that an additional characteristic frequency component is generated in the “collision” state. The magnitude of the additional characteristic frequency component is monitored in real time, and the probe-sample separation is adjusted to maintain the monitored magnitude at an optimal value to operate the AFM system at near-grazing conditions.
REFERENCES:
patent: 5412980 (1995-05-01), Elings et al.
Ashida Kiwamu
Balachandran Balakumar
Dick Andrew James
Hayashi Keiichi
Kuroda Masaharu
National Institute of Advanced Industrial Science and Technology
Raevis Robert R
Rosenberg , Klein & Lee
University of Maryland
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