Method of on-chip current measurement and semiconductor IC

Details Method of on-chip current measurement and semiconductor IC Method of on-chip current measurement and semiconductor IC

2010-09-09

2011-10-04

Diao, M'Baye (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010

Reexamination Certificate

active

08030956

ABSTRACT:
A semiconductor integrated circuit that includes a circuit block having a predetermined function, a power switch capable of supplying an operating power to the circuit block, and a current measuring circuit for obtaining a current flowing to the circuit block based on a voltage between terminals of the power switch in a state in which the power switch is turned on and an on-resistance of the power switch. Thus, it is possible to measure a current of the circuit block in a state in which a chip is normally operated.

REFERENCES:
patent: 6888395 (2005-05-01), Mizuno et al.
patent: 6927592 (2005-08-01), Manhaeve et al.
patent: 6949942 (2005-09-01), Eldridge et al.
patent: 7282905 (2007-10-01), Chen et al.
patent: 7339803 (2008-03-01), Nojima
patent: 2003/0141926 (2003-07-01), Mizuno et al.
patent: 2006/0038578 (2006-02-01), Hashimoto
patent: 2009/0113186 (2009-04-01), Kato et al.
patent: 2009/0134904 (2009-05-01), Zjajo et al.
patent: 62-278473 (1987-12-01), None
patent: 5-288798 (1993-11-01), None
patent: 63-93142 (1998-04-01), None
patent: 2000-206174 (2000-07-01), None
patent: 2003-218682 (2003-07-01), None
patent: 2006-174132 (2006-06-01), None

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