Method of obtaining proper probe alignment in a multiple contact

Details Method of obtaining proper probe alignment in a multiple contact Method of obtaining proper probe alignment in a multiple contact

1976-10-04

1977-10-11

Aegerter, Richard E.

Geometrical instruments

Area integrators

Electrical

33 1M, 33174TA, 33185R, G01B 700, B27G 2300

Patent

active

040527930

ABSTRACT:
Disclosed is a method of aligning a plurality of probes to a plurality of contacts, the contacts being arragned in a pattern on a substrate. The method includes the steps of powering one of a selected pattern of probes or a like pattern of selected contacts such that upon the selected patterns being in coincidence, the plurality of probes will be in contact with predetermined contacts on the substrate. This is accomplished by providing a circuit path through all of the other probes or contacts which are not powered and then bringing the plurality of probes into contact at random with the contacts of the substrate and then moving one of the substrate and probes until the selected patterns coincide as by indication of a completed circuit path between selected patterns.

REFERENCES:
patent: 2972815 (1961-02-01), Weeks
patent: 3628497 (1971-12-01), Neu
Dykstra, "Method of Making Artmasters for Circuit Boards Utilizing Land Areas Having Locating Pins", W. Electric Tech. Dig., No. 23, pp. 15-16, July, 1971.

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