Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1998-02-02
1999-07-13
Kim, Robert H.
Optics: measuring and testing
By particle light scattering
With photocell detection
356349, G01B 902
Patent
active
059234229
ABSTRACT:
A method of obtaining an FT spectrum according to Brault is improved in that the compensation filter is determined by recording a broad-band effective interferogram, carrying out complex Fourier transformation, forming a mean value of the phase spectra, converting the abscissa values into electrical frequencies, and establishing the transfer function of the detector and of the further signal processing elements, wherein the free parameters of the transfer function are chosen such that the phase response of the transfer function deviates as little as possible from the mean value of the phase spectrum of the effective recorded interferogram. If necessary, the determined transfer function is then digitized. The compensation filter is then determined as the inverse of the discrete transfer function. In this way, deconvolution of the signal processing elements transfer function from the spectra is facilitated in a particularly simple and effective manner.
REFERENCES:
patent: 5491548 (1996-02-01), Bell et al.
Applied Optics, vol. 35, No. 16 (Jun. 1, 1996): James W. Brault "New approach to high-precision Fourier transform spectrometer design".
Werner Herres and J. Gronholz: "Datenverarbeitung in der FT-IR-Spektroskopie" in Comp. Anw. Lab., No. 5/1984, pp. 352-356, vol. 6/1984, pp. 418-425 and vol. 5/1985, pp. 230-240.
Andreas Antoniou: "Digital Filters: Analysis and Design", McGraw-Hill Inc., 1979, pp. 171-175.
Keens Axel
Rapp Norbert
Bruker Analtyik GmbH
Kim Robert H.
Lee Andrew H.
Vincent Paul
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