Method of obtaining a D(log E) curve

Details Method of obtaining a D(log E) curve Method of obtaining a D(log E) curve

1976-04-09

1977-06-07

Corbin, John K.

Optics: measuring and testing

Inspection of flaws or impurities

Bore inspection

G01N 2106

Patent

active

040279804

ABSTRACT:
The D(log E) curve of an unknown film is obtained by first measuring a first film having a known D(log E) curve and of the same type as the unknown film. Measured are the densities of a plurality of objects and their corresponding distances for which the object densities decay to film base densities. These values are plotted and with the known D(log E) curve, an x(log E) curve is obtained which is valid for all films of this type. The unknown film is measured to obtain values of object densities and corresponding decay distances and a curve of the values is obtained, and when used with the x(log E) curve for the film type, a new D(log E) curve is obtained for the unknown film.

REFERENCES:
patent: 2799581 (1957-07-01), Bullock
patent: 3096176 (1963-07-01), Craig
patent: 3883251 (1975-05-01), Helava

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