Optics: measuring and testing – Dimension – Cavities
Reexamination Certificate
2003-03-21
2004-09-21
Rosenberger, Richard A. (Department: 2877)
Optics: measuring and testing
Dimension
Cavities
C073S082000
Reexamination Certificate
active
06795201
ABSTRACT:
BACKGROUND OF THE INVENTION
The present invention generally relates to surface marks on objects and, more particularly, is concerned with a method of objectively evaluating a surface mark. The term “mark” as used hereinafter means any visible trace or impression on a surface, such as a line, dot, spot, stain, scratch, mar, blemish, dent, bruise, etc., on the surface.
A human observer perceives a mark on a surface of an object, such as an automotive body panel, as a point of contrast from the rest of the surface. The contrast seen by the human observer is affected by the size, color and gloss of the mark as well as of the surface that is marked. However, any attempt at visual quantification of the contrast by the human observer will necessarily be subjective and vary from one human observer to the next.
A review of the prior literature and patent art reveals the absence of an objective approach to optical quantification of surface marks. Thus, heretofore the evaluation of surface marks has been mainly dependent upon the subjective perception of the human observer making the evaluation.
Consequently, a need exists for an innovation which will provide an objective approach to quantification of surface marks.
BRIEF SUMMARY OF THE INVENTION
In one embodiment the present invention provides a method of objectively evaluating a surface mark which is designed to satisfy the aforementioned need. Thereto, the method of the present invention provides a reliable objective test methodology for optical quantification of surface marks which avoids the subjectivity of human visual perceptions of surface marks.
In one embodiment the present invention is a method of objectively evaluating a surface mark, comprising the steps of:
reproducibly producing a surface mark on an object; and
optically evaluating the surface mark by optically producing images of the surface mark by (i) illuminating the surface mark at a first angle relative to a reference plane extending substantially perpendicular to the surface mark; and (ii) capturing an image of the illuminated surface mark at a second angle relative to the reference plane, wherein the orientation of the surface mark in the plane of the sample surface is horizontal to image detector means.
REFERENCES:
patent: 4502225 (1985-03-01), Lin
patent: 4627096 (1986-12-01), Grattoni et al.
patent: 4641017 (1987-02-01), Lopata
patent: 4991967 (1991-02-01), Creighton
patent: 5185638 (1993-02-01), Conzola et al.
patent: 5355721 (1994-10-01), Las Navas Garcia
patent: 5386481 (1995-01-01), Hine et al.
patent: 5774212 (1998-06-01), Corby, Jr.
patent: 6247355 (2001-06-01), Suresh et al.
patent: 06 066528 (1994-03-01), None
patent: 08 037168 (1996-02-01), None
patent: 09 061365 (1997-03-01), None
patent: WO 95 10097 (1995-04-01), None
patent: WO 95 35506 (1995-12-01), None
Watanabe, et al., Telecentric Optics for Computational Vision, Proceedings of Image Understanding Workshop, Palm Springs (Feb. 1996).*
P. Rangarajan et al, “Scratch visibility of Polymers Measured Using Optical Imaging”, Polymer Engineering and Science, vol. 43, No. 3, Mar. 2003.
Gordon Research Conference on “Coatings&Films”, Colby Sawyer College, New London, New Hampshire presented on Jul. 19, 2001.
SAE 2001 World Congress, Mar. 2001, Detroit, MI USA presented on Mar. 5, 2001.
American Physical Society Meeting, Indianapolis, Indiana presented on Mar. 20, 2002.
Devitt John William
Harding Kevin George
Rangarajan Pratima
Watkins Vicki Herzl
Barth Vincent P.
General Electric Company
Parker Kimberly H.
Patnode Patrick K.
Rosenberger Richard A.
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