Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate
2006-07-18
2006-07-18
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
By particle light scattering
With photocell detection
C356S343000, C356S364000
Reexamination Certificate
active
07079243
ABSTRACT:
A method of noise reduction in a system where polarization mode fluctuations contribute to the noise in a signal is provided. Specifically, a corrected signal is formed by adjusting the relative and overall intensity of the orthogonal polarization components of an unpolarized laser source at a first detector positioned at a first angle with respect to the laser beam axis so that the first detector has the same sensitivity to polarization as a second detector positioned at a second angle with respect to the laser beam axis. This corrected signal is then subtracted from the signal at the second detector which detects a desired signal.
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Sandberg Jon C.
Turchette Quentin A.
Greenlee Winner and Sullivan P.C.
Pham Hoa Q.
Research Electro-Optics, Inc.
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