Method of multi-turn time-of-flight mass analysis

Details Method of multi-turn time-of-flight mass analysis Method of multi-turn time-of-flight mass analysis

2005-09-27

2005-09-27

Nguyen, Kiet T. (Department: 2881)

Radiant energy

Ionic separation or analysis

Methods

C280S287000

Reexamination Certificate

active

06949736

ABSTRACT:
A method of mass analysis using a multi-turn time-of-flight mass spectrometer starts with recording plural heterogeneous turn number spectra F1(t), F2(t), . . . , Fq(t) containing plural ion peaks that might be different in number of turns, the spectra being obtained with different ion residence times taken from entry to departure using a multi-correlation function for reconstructing a single turn number spectrum.

REFERENCES:
patent: 6037586 (2000-03-01), Baril
patent: 6300625 (2001-10-01), Ishihara
patent: 11-135060 (1999-05-01), None
patent: 11-135061 (1999-05-01), None
patent: 11-195398 (1999-07-01), None

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