Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2007-10-16
2007-10-16
Rodriguez, Paul (Department: 2123)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
C703S002000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
10876218
ABSTRACT:
Techniques for modeling a circuit cell of a microprocessor or other integrated circuit for hierarchical powergrid analysis are disclosed herein. Distribution coefficients, used to distribute node voltages and capacitances to respective parts of the cell, are determined for each internal node of the cell. Current distribution coefficients may also be determined for each resistor in the cell. Using the distribution coefficients, internal cell capacitances are modeled as port capacitors. Resistive elements are modeled as a resistor network having no internal nodes. Transistor elements are modeled as port current sources. Such a model permits back calculation of internal node voltages and currents.
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Qi Xiaoning
Trivedi Anuj
Yan Kenneth Y.
Craig Dwin McTaggart
Dorsey & Whitney LLP
Rodriguez Paul
Sun Microsystems Inc.
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