Method of minimizing implant-related damage to a group II-VI sem

Details Method of minimizing implant-related damage to a group II-VI sem Method of minimizing implant-related damage to a group II-VI sem

1989-06-05

1990-05-22

Chaudhuri, Olik

Fishing, trapping, and vermin destroying

437 31, 437 37, 437150, 437151, 437162, 437163, 437164, 437911, 437987, H01L 21385, H01L 21425

Patent

active

049277731

ABSTRACT:
A method of forming in a semiconductor material a region having a different chemical composition or a different concentration than a chemical composition or concentration of material surrounding the region. The method includes an initial step of providing a substantially single crystalline body of material, such as an epitaxial layer 10 of HgCdTe. Another step forms a cap layer 12 over a surface of the body, the layer having a thickness T. The cap layer 12 is comprised of a layer of polycrystalline material, such as CdTe, or is comprised of a layer of an organic material, an amorphous dielectric or a single-crystalline layer. A further step implants a selected chemical species through an upper surface of the cap, the species being implanted to a depth such that substantially no implant damage is sustained by the underlying body. In p-n junction formation the species is selected to form a region having an opposite type of electrical conductivity than the conductivity of the layer 10. A further step diffuses during a thermal anneal the implanted species from the cap layer down into the underlying layer to form a region therein having a different chemical composition or concentration than the chemical composition or concentration of the material surrounding the region. The method is also shown to be suitable for bipolar and JFET transistor fabrication in Group II-VI and Group III-V materials.

REFERENCES:
patent: 4389768 (1983-06-01), Fowler
patent: 4431460 (1984-02-01), Barson et al.
patent: 4617724 (1986-10-01), Yokoyama et al.
patent: 4629520 (1986-12-01), Ueno et al.
patent: 4824798 (1989-04-01), Burnham et al.

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