Method of measuring the thermal hysteresis of quartz crystal res

Details Method of measuring the thermal hysteresis of quartz crystal res Method of measuring the thermal hysteresis of quartz crystal res

1988-08-29

1990-04-17

Tarcza, Thomas H.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Piezoelectric crystal testing

324 80, G01R 2922

Patent

active

049183729

ABSTRACT:
The thermal hysteresis of quartz crystal resonators is measured by exciting two modes of a quartz crystal of interest with an external frequency source at a preselected temperature, calculating the difference frequency as between the modes, resetting to the original set temperature after temporarily altering the temperature, remeasuring the frequencies while maintaining the temperature and the difference frequency at the same respective values as the original values, and taking the mode frequency difference as representative of the thermal hysteresis of the crystal.

REFERENCES:
patent: 4084131 (1978-04-01), Matthey
patent: 4158805 (1979-06-01), Ballato
patent: 4412172 (1983-10-01), Vig
Forster, "Automatische Aufzeichnung des Frequenz-Temperatur-Verlaufs von wingquarzen"; Frequenz, (31, 1977, 12; pp. 375-381).

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