Method of measuring the temperature of a photocathode

Electric lamp or space discharge component or device manufacturi – Process – With testing or adjusting

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374123, 364557, 445 51, H01J 9233

Patent

active

047086777

ABSTRACT:
A method of determing the actual temperature of a layer of an infrared material, especially during heat cleaning, which includes measuring the thickness of the layer and the amount of radiation being emitted from it. An apparent temperature corresponding to a desired actual temperature is found from a curve of apparent temperature, which are derived from the radiation amount, versus thickness. The apparent temperature which corresponds to the desired actual temperature compensates for interference effects on the radiation measurement. A computer may be utilized to calculated the apparent temperature which corresponds to the desired actual temperature and to regulate and maintain the infrared material at the apparent temperature.

REFERENCES:
patent: 3245261 (1966-04-01), Buteux
patent: 3759102 (1973-09-01), Murray
patent: 3793630 (1974-02-01), Meijer
patent: 4418392 (1983-11-01), Hata

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