Method of measuring the performance of a transceiver in a...

Details Method of measuring the performance of a transceiver in a... Method of measuring the performance of a transceiver in a...

2007-05-15

2007-05-15

Ha, Dac V. (Department: 2611)

Pulse or digital communications

Testing

Phase error or phase jitter

C375S365000, C375S371000, C370S509000, C370S516000, C714S010000, C714S047300, C714S703000, C714S704000, C714S715000

Reexamination Certificate

active

10717047

ABSTRACT:
The performance of a serial data transceiver in a programmable logic device may be determined by applying a stress sequence of sequential data to a receiver of the transceiver, comparing the received data to reference data and determining the number of errors.

REFERENCES:
patent: 5481563 (1996-01-01), Hamre
patent: 6463109 (2002-10-01), McCormack et al.
patent: 6618686 (2003-09-01), Allamsetty
patent: 6633605 (2003-10-01), Katsman et al.
patent: 6874107 (2005-03-01), Lesea
patent: 7025205 (2006-04-01), Barker
U.S. Appl. No. 09/912,683, filed Jul. 24, 2001, Lesea.
Asad Aziz, “Passive Filters Upgrade Jitter Testing,” EETimes Newsletter, Feb. 22, 2002, pp. 1-3, available from EETimes, http://www.eetimes.com/story/OEG20020214S0041.
IEEE, Draft Supplement to IEEE std. 802.3, IEEE Draft P802.3ae/D2.01, Jan. 15, 2001, pp. 1-3, available from IEEE, 3 Park Avenue, 17th Floor, New York, NY 10016-5997.

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