X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-10-16
2007-10-16
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S057000
Reexamination Certificate
active
11300939
ABSTRACT:
A method of measuring a momentum transfer spectrum of elastically scattered X-ray quanta which emanate from a scatter voxel inside an object to be examined is described. A scatter voxel emits X-radiation in an X-direction and has a primary collimator which allows through only primary radiation aimed at a single isocentre at the origin of a Cartesian coordinates system. The X-ray quanta are emitted at an angle of scatter (Θ) with a constant Z-component (Θz). The method includes simultaneous recording of the energy spectrum of scatter quanta from the scatter voxel at different angles of scatter (Θ) with a spatially-resolving and energy-resolving detector in the Y-Z plane, determining the momentum transfer from the geometric data of the radioscopy unit for different angles of scatter (Θ), and combining respective diffraction profiles belonging to different angles of scatter (Θ) to produce a total-diffraction profile.
REFERENCES:
patent: 5008911 (1991-04-01), Harding
patent: 5265144 (1993-11-01), Harding et al.
patent: 5394454 (1995-02-01), Harding
patent: 5461653 (1995-10-01), Parker
patent: 5612988 (1997-03-01), Martens
patent: 5805662 (1998-09-01), Kurbatov et al.
patent: 6005916 (1999-12-01), Johnson et al.
patent: 6470067 (2002-10-01), Harding
patent: 6744845 (2004-06-01), Harding et al.
patent: 6895071 (2005-05-01), Yokhin et al.
patent: 7120226 (2006-10-01), Ledoux et al.
patent: 2002/0150209 (2002-10-01), Yokhin
patent: 2003/0031295 (2003-02-01), Harding
patent: 2003/0091147 (2003-05-01), Takata et al.
patent: 2006/0140340 (2006-06-01), Kravis
Armstrong Teasdale LLP
GE Homeland Protection Inc.
Glick Edward J.
Hyun, Esq. Eugene
Midkiff Anastasia S.
LandOfFree
Method of measuring the momentum transfer spectrum of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of measuring the momentum transfer spectrum of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of measuring the momentum transfer spectrum of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3876735