Method of measuring the memory address access time (AAT) utilizi

Details Method of measuring the memory address access time (AAT) utilizi Method of measuring the memory address access time (AAT) utilizi

1980-04-18

1982-05-25

Malzahn, David H.

Excavating

324 73R, G06F 1122, G01R 1512

Patent

active

043320287

ABSTRACT:
Disclosed is a method and apparatus (tester) for measuring the memory address access time (AAT) of RAM and ROS memories. The method and apparatus utilizes the data recirculation technique. The method is based on the following principle: memory (20, FIG. 9) is loaded with a predetermined data configuration, and, then, the output lines (d.O) of the memory are looped back and connected to the address lines (ad), through .tau.-delay lines (22); it is established that the memory oscillates with frequency ##EQU1## deducing therefrom the AAT time which is the required address access time, factor p being a function of the loaded configuration. The tester implementing such a method is illustrated in the drawing. In a first step, the data configuration contained in block (95) is transferred to memory (20), through multiplexer (94), to the appropriate addresses (di), through multiplexer (93), under the control of counter (92) and clock (91); the read/write selection line (21) is in "write" position. In a second step, line (21) is set in "read" position. The data contained in the memory are recirculated through the delay lines (22) and multiplexer (93). The oscillation frequency F, then, is measured with a frequency meter (not shown) mounted in an output line dO.

REFERENCES:
patent: 3781670 (1973-12-01), McMahon, Jr.
patent: 3805152 (1974-04-01), Ebersman et al.
patent: 4194245 (1980-03-01), Pascoe et al.
Cavaliere et al., "Delay Measurements for High Performance Chips", IBM Tech. Disclosure Bulletin, vol. 20, No. 11B, Apr. 1978, pp. 4799-4801.
Squarzini, Jr., "AC Sample Testing", IBM Tech. Disclosure Bulletin, vol. 13, No. 5, Oct. 1970, p. 1373.

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