Method of measuring the eccentricity of a waveguide embedded in

Details Method of measuring the eccentricity of a waveguide embedded in Method of measuring the eccentricity of a waveguide embedded in

1989-02-28

1991-02-19

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

25022724, 350 9620, G01N 2186

Patent

active

049946790

ABSTRACT:
The invention relates to a method of measuring the eccentricity of a waveguide embedded in a cylindrical connector pin. The optical center of the end face of the waveguide is introduced into the mechanical axis of rotation of a distance sensor scanning the outer surface of the connector pin. Subsequently, the eccentricity of the waveguide is determined from the measuring values obtained during the relative rotation of the distance sensor along the outer surface of the connector pin.

REFERENCES:
patent: 3800388 (1974-04-01), Borner et al.
patent: 4763980 (1988-08-01), Gerber et al.
patent: 4775947 (1988-10-01), Marron

Affiliated with

Also associated with

Rating

Method of measuring the eccentricity of a waveguide embedded in does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of measuring the eccentricity of a waveguide embedded in , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of measuring the eccentricity of a waveguide embedded in will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1145659