Method of measuring the current-voltage characteristics of a DUT

Details Method of measuring the current-voltage characteristics of a DUT Method of measuring the current-voltage characteristics of a DUT

1992-07-24

1995-04-11

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324766, 324767, G01R 104

Patent

active

054062179

ABSTRACT:
The present invention relates to a method of measuring the current-voltage characteristics of a DUT by controlling a voltage source and current source of the measurement apparatus by changing a predetermined current value in the current source or a predetermined voltage value in the voltage source in response to an output characteristic. For example, in utilizing a voltage source, the output current limiting value is incremented by a predetermined amount when the current output of a DUT reaches the current limiting value before the voltage output reaches a desired value. The current and voltage outputs of the DUT do not change unless the current limiting value is first incremented. Thus, the output characteristics with a rapid change in the DUT are more accurately measured by controlling the input and output of the DUT.

REFERENCES:
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patent: 4467275 (1984-08-01), Maeda et al.
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patent: 4528503 (1985-07-01), Cole
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Maeda, et al., Intelligent Instrument Streamlines dc Semiconductor Parameter Measurements, pp. 3-14, vol. 33, No. 10, Hewlett-Packard Journal, Oct. 1982.
Hewlett Packard Operation and Service Manual, Model 4145A, Semiconductor Parameter Analyzer, Printed: Aug., 1994.
Takagi, et al., Programmable Stimulus/Measurement Units Simplify Device Setups, pp. 15-20, vol. 33, No. 10, Hewlett-Packard Journal, Oct. 1982.

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