Method of measuring the content of given element in a sample by

Details Method of measuring the content of given element in a sample by Method of measuring the content of given element in a sample by

1980-07-22

1982-09-14

Smith, Alfred E.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 83, G01N 2320, G21K 100

Patent

active

043497381

ABSTRACT:
A method of measuring the content of a given element in a sample by means of X-ray radiation. The sample is first irradiated with primary radiation of a given wave length, to excite first composite fluorescent radiation from the sample whose content of said element is to be determined. Subsequent hereto the sample is then irradiated with primary radiation having a shorter wave length than the first mentioned radiation, to excite a second fluorescent radiation from said sample. The magnitude of the first fluorescent radiation is then subtracted from the magnitude of the second fluorescent radiation, whereat the difference therebetween constitutes the intensity of fluorescence radiation of the shortest wave length which can be excited by the primary radiation having the shorter wave length.

REFERENCES:
patent: 3114832 (1963-12-01), Alvarez
patent: 3525863 (1970-08-01), Constantine et al.

Affiliated with

Also associated with

Rating

Method of measuring the content of given element in a sample by does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of measuring the content of given element in a sample by , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of measuring the content of given element in a sample by will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2156441