Method of measuring properties of particles and...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07924431

ABSTRACT:
A method of measuring properties of particles includes generating a beam of radiation (IW); illuminating with the beam (IW) an observation region (MR) which is transited by a particle (B). A portion of the beam (IW) gives rise to radiation (SW) which is scattered by scattering interaction with the particle (B), and another portion (TW) is transmitted substantially undisturbed through the observation region (MR). In a detection plane (M), a plurality of radiation intensity values are detected which are determined by the interference between the scattered radiation (SW) and the transmitted radiation (TW). The detection of the radiation intensity values in the detection plane (M) is carried out according to a time sequence of acquisitions corresponding to successive transit positions of the particle through the observation region (MR). On the basis of the time sequence of acquisitions, the trend of a parameter of asymmetry of the distribution of the plurality of radiation intensity values with respect to the optical axis (z), due to the successive transit positions of the particle (B), is determined as a function of time. Depending on the trend of the parameter of asymmetry determined as a function of time, the trends of phase delay and amplitude of the scattered radiation (SW) with respect to the transmitted radiation (TW) are determined as a function of time, and the properties of the particle (B) are determined on the basis of the trends of the phase delay and amplitude of the scattered radiation (SW) as a function of time.

REFERENCES:
patent: 6219138 (2001-04-01), Swanson et al.
patent: 7268874 (2007-09-01), Brogioli et al.
patent: 2004/0239932 (2004-12-01), Brogioli et al.
patent: WO 2005/083389 (2005-09-01), None
Bassini, Alessandra et al. “Interferometric system for precise submicrometer particle sizing.” Applied Optics, Optical Society of America, vol. 35 No. 31. Nov. 1997.
Taubenblatt, M.A., et al. “Measurement of the size and refractive index of a small particle using the complex forward-scattered electromagnetic field.” Applied Optics, Optical Society of America, vol. 30 No. 33. Nov. 1991.
Pralle et al. “Three-Dimensional High-Resolution Particle Tracking for Optical Tweezers by Forward Scattered Light.” Microscopy Research and Technique, vol. 44 pp. 378-386. 1999.
Hirleman, Dan E. “Laser Technique for simultaneous particle-size and—velocity measurements.” Optics Letters vol. 3, No. 1, 1978.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of measuring properties of particles and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of measuring properties of particles and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of measuring properties of particles and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2657667

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.