Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-08-13
1999-08-31
Kim, Robert H.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 731, 356153, G01B 1114, G01B 1126, G01N 2100
Patent
active
059460997
ABSTRACT:
In a retainer holding a plurality of optical transmission members at given positions, a position of an optical center of each of the optical transmission members is measured at a high measuring accuracy. In this case, a lens system forming a beam waist in its output beam is arranged so as to oppose to an end face of each of the optical transmission members, and then the output beam is input to the optical transmission member, and subsequently a position of the lens system is measured when a light intensity of a beam emanated from the optical transmission member is maximum, and thereafter a position of the optical transmission member is calculated from the measured value.
REFERENCES:
patent: 5218415 (1993-06-01), Kawashima
Abstract JP 58 092805 A (Nihon Kougaku Kogyo, KK), Jun. 2, 1983.
Fukuyama Masashi
Kondo Yoshimasa
Kurimoto Hironori
Ota Takashi
Kim Robert H.
Merlino Amanda
NGK Insulators Ltd.
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