Method of measuring plating amount and plating film composition

Details Method of measuring plating amount and plating film composition Method of measuring plating amount and plating film composition

1990-02-07

1992-01-14

Howell, Janice A.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 44, 378 48, 378 53, G01N 23223

Patent

active

050816586

ABSTRACT:
The plating amount and composition of a plated steel plate are measured by determining a theoretical relation for an intensity at two different light-receiving angles of K-series fluorescent X-rays of analysis target elements reflected by the plate when monochromatized X-rays are radiated onto the plate at two incident angles, measuring a fluorescent X-ray intensity by using standard samples having known plating amounts and compositions, under the same conditions as for obtaining the theoretical relation, and calculating a conversion coefficient for converting the measured value into a theoretical value by the theoretical relation, measuring a fluorescent X-ray intensity obtained from a plated steel plate to be measured having unknown plating amount and composition under the same conditions for obtaining the theoretical relation, and converting the measured fluorescent X-ray intensity into a theoretical intensity by using the conversion coefficient, and calculating a plating amount and composition as parameters in the theoretical relation, which minimize a difference between the theoretical intensity obtained by the theoretical relation and the converted theoretical intensity, as a plating amount and composition of the plate to be measured.

REFERENCES:
patent: 3703726 (1972-11-01), Stephenson
patent: 4764945 (1988-08-01), Tadahiro

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