Electricity: measuring and testing – Determining nonelectric properties by measuring electric... – Semiconductors for nonelectrical property
Patent
1990-01-12
1992-06-09
Wieder, Kenneth A.
Electricity: measuring and testing
Determining nonelectric properties by measuring electric...
Semiconductors for nonelectrical property
324439, G01N 2700
Patent
active
051210509
ABSTRACT:
The present invention is characterized by a solid body disposed so that a remarkably small gap may be formed between it and a surface of an electrode. A super-thin liquid membrane is formed in the small gap by an interfacial tension of a liquid. An object to be measured is applied to or acted upon either the solid body or the super-thin liquid membrane. An electric signal due to the physical properties of the super-thin liquid membrane itself or an electric signal due to a chemical or physical reaction, which is generated on an interface of the solid body and the super-thin liquid membrane and diffused through the super-thin liquid membrane itself, is detected by means of the electrode to measure the physical properties of the object to be measured.
REFERENCES:
patent: 2925370 (1960-02-01), Rohrer
patent: 3434953 (1969-03-01), Porter et al.
patent: 3528287 (1970-09-01), Melcher
patent: 4123701 (1978-10-01), Josefsen et al.
patent: 4439526 (1984-03-01), Columbus
patent: 4529495 (1985-07-01), Marsoner
patent: 4713347 (1987-12-01), Mitchell et al.
patent: 4777019 (1988-10-01), Dandekar
patent: 4797188 (1989-01-01), Tomita
patent: 4816132 (1989-03-01), Kotani et al.
patent: 4902399 (1990-02-01), Durley, III et al.
patent: 4911794 (1991-03-01), Parce et al.
Kohno Takeshi
Kojima Junji
Kotani Haruo
Tomita Katsuhiko
Horiba Ltd.
Wieder Kenneth A.
LandOfFree
Method of measuring physical properties by super-thin liquid mem does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of measuring physical properties by super-thin liquid mem, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of measuring physical properties by super-thin liquid mem will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1807092