Method of measuring performance of a semiconductor device...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

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07119570

ABSTRACT:
A test circuit to test rise delay/fall delay performance on a semiconductor device may comprise a latch to latch data at its input responsive to a clock signal. The latch may source an output signal related to the data latched. A buffer chain may be configured to serially propagate the signal sourced by the latch from the latch output back to the clock input, as the clock signal. A reset/set input of the latch may be configured to receive a reset/set signal from an intermediate node of the buffer chain.

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patent: 6219305 (2001-04-01), Patrie et al.
patent: 6239621 (2001-05-01), Milshtein et al.
patent: 6891440 (2005-05-01), Straub et al.

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