Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-10-10
2006-10-10
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07119570
ABSTRACT:
A test circuit to test rise delay/fall delay performance on a semiconductor device may comprise a latch to latch data at its input responsive to a clock signal. The latch may source an output signal related to the data latched. A buffer chain may be configured to serially propagate the signal sourced by the latch from the latch output back to the clock input, as the clock signal. A reset/set input of the latch may be configured to receive a reset/set signal from an intermediate node of the buffer chain.
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Chirania Manoj
Costello Philip
Kondapalli Venu M.
Voogel Martin L.
Fields Walter D.
Hollington Jermele
Liu Justin
Xilinx , Inc.
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