Optics: measuring and testing – By polarized light examination
Patent
1994-12-22
1996-07-02
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
356367, 250225, G01J 400
Patent
active
055328237
ABSTRACT:
There is disclosed a method for measuring retardation .DELTA.nd of a liquid crystal cell in which a linearly polarized light beam is impinged upon a liquid crystal cell, the liquid crystal cell is rotated in a plane perpendicular to an optical axis of a measuring optical system so that the transmission through the liquid crystal cell for the light beam having a polarization parallel to that of the incident light beam becomes maximal, the wavelength of the incident light beam is varied to detect at least one wavelength .lambda..sub.s at which the transmission has an extreme and, finally, .DELTA.nd is calculated from .DELTA.nd=.lambda..sub.s .sqroot.m.sup.2 -(1/4) for the case of m-th minimal transmission or from .DELTA.nd=.lambda..sub.s .sqroot.m.sup.2 +m for the case of m-th maximal transmission.
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Fukui Atsushi
Ito Masami
Nishii Kanji
Takamoto Kenji
Matsushita Electric - Industrial Co., Ltd.
Pham Hoa Q.
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