Optics: measuring and testing – Photometers
Reexamination Certificate
2007-07-25
2009-11-17
Toatley, Jr., Gregory J (Department: 2877)
Optics: measuring and testing
Photometers
C356S416000, C356S124000, C349S057000, C349S106000, C349S119000
Reexamination Certificate
active
07619726
ABSTRACT:
A color filter with low color shift is defined by a light leakage spectrum in the dark state. The color filter is disposed between two polarizing plates so as to measure a first spectrum of dark state a(λ), wherein the polarizing directions of the polarizers are orthogonal to each other. A second spectrum of dark state b(λ) while the color filter is removed, and then a ratio spectrum of light leakage intensity I(λ)=(a(λ)/b(λ)) is determined. A maximum value P1in the ratio spectrum of light leakage intensity is determined in a wavelength region in which the ratio spectrum of light leakage intensity of green photoresist overlaps that of a blue photoresist. A maximum value P2in the ratio spectrum of light leakage intensity is determined in a wavelength region in which the ratio spectrum of light leakage intensity of red photoresist locates. An average value P1,avgof several ratios of light leakage intensity around the value P1, and an average value P2,avgof several ratios of light leakage intensity around the value P2are determined. The color filter with low color shift meets the following formula 0.74≦P1,avg/P2,avg≦2.
REFERENCES:
patent: 6359671 (2002-03-01), Abileah
Cheng Sheng-Wen
Liao Chen-Hsien
Wang Shiao-Wen
AU Optronics Corp.
Birch & Stewart Kolasch & Birch, LLP
Slomski Rebecca C
Toatley Jr. Gregory J
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