Method of measuring gate capacitance by correcting...

Details Method of measuring gate capacitance by correcting... Method of measuring gate capacitance by correcting...

2007-11-20

2007-11-20

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S659000

Reexamination Certificate

active

10784784

ABSTRACT:
A gate capacitance of a MOS transistor is determined by (a) measuring the gate capacitance and dissipation factor; (b) obtaining a channel resistance and a tunneling resistance; (c) setting an initial capacitance and an error dissipation factor; (d) calculating a direct dissipation factor using the channel resistance, the tunneling resistance, and the initial capacitance; (e) calculating a calculated dissipation factor using the error dissipation factor, the direct dissipation factor, and the measured dissipation factor; (f) calculating a calculated capacitance using the channel resistance, the tunneling resistance, the initial capacitance, the error dissipation factor, and the measured dissipation factor; and (g) detecting the initial capacitance as an accurate gate capacitance of the transistor if it is determined that the calculated capacitance is equal to the measured capacitance and the calculated dissipation factor is equal to the measured dissipation factor, and otherwise repeating steps (c) through (g).

REFERENCES:
patent: 3049666 (1962-08-01), Anderson
patent: 4267503 (1981-05-01), Westra
patent: 6069485 (2000-05-01), Long et al.
patent: 6426671 (2002-07-01), Kono
patent: 6560567 (2003-05-01), Yechuri

Affiliated with

Also associated with

Rating

Method of measuring gate capacitance by correcting... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of measuring gate capacitance by correcting..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of measuring gate capacitance by correcting... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3849963