Measuring and testing – Gas analysis – Detector detail
Patent
1998-03-06
1999-12-28
Larkin, Daniel S.
Measuring and testing
Gas analysis
Detector detail
73 232, 73 3104, G01N 712
Patent
active
060065869
ABSTRACT:
A method of measuring a gas concentration for measuring any one of the concentrations of NOx, NO.sub.2, NO, and O.sub.2 by using one or more sensor elements utilizing a metal oxide semiconductor as a sensing element is disclosed. In the method of measuring a gas concentration, any one of the partial pressures of NO.sub.2, NO, and O.sub.2 is calculated on the basis of the following formula (1), and any one of the concentrations of NOx, NO.sub.2, NO, and O.sub.2 is measured on the basis of the calculated partial pressure; ##EQU1## wherein R is resistance and A-H and Q are constant.
REFERENCES:
patent: 5602326 (1997-02-01), Takahashi et al.
patent: 5705129 (1998-01-01), Takahashi et al.
patent: 5763763 (1998-06-01), Kato et al.
Patent Abstracts of Japan vol. 098, No. 002, Jan. 30, 1998 & JP 09264861 A (NGK Insultars Ltd), Oct. 7, 1997.
Ogawa Naoyuki
Takahashi Tomonori
Yoshida Toshihiro
Larkin Daniel S.
NGK Insulators Ltd.
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