Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-06-23
2008-08-19
Nghiem, Michael P. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07415373
ABSTRACT:
A method for measuring a frequency translation device under test by using a vector network analyzer and a reference frequency translation device that includes measuring the network characteristics of the reference frequency translation device by using the vector network analyzer, measuring the network characteristics of a circuit including the reference frequency translation device and the frequency translation device under test by using the vector network where the reference frequency translation device has an operation complementary to the frequency translation device under test, and removing the network characteristics of the reference frequency translation device from the measured network characteristics of the circuit.
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German Patent and Trademark Office Search Report for German Patent Application No. 10 2005 030 221.1, dated May 4, 2006.
Komatsu Yasuaki
Yanamaka Haruhiko
Agilent Technologie,s Inc.
Khuu Cindy H
Nghiem Michael P.
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