Method of measuring electrical characteristics of electronic cir

Details Method of measuring electrical characteristics of electronic cir Method of measuring electrical characteristics of electronic cir

1989-10-30

1991-10-01

Lall, Parshotam S.

Boots, shoes, and leggings

364481, 371 27, G01R 3128

Patent

active

050539817

ABSTRACT:
In a method of measuring characteristics of an electronic circuit on a plurality of measurement items by means of a measuring apparatus which operates in accordance with a measurement execution program, a plurality of measurement specifications the measurement items are expressed in the form of a measurement specification description table of a fixed-word-length type. A measurement specification description program is formed in which the measurement specification description table is directly reflected. A measurement execution program is formed by appointing a measuring sequence in the measurement specification description program and by removing redundancy and combining programs of a plurality of measuring items which can be measured in parallel. The measurement execution program is subjected to a debugging conducted by operating the measuring apparatus in accordance with the measurement execution program. The measurement specification description program is amended in accordance with the modification of the measurement execution program effected through the debugging. The characteristics of the electronic circuit are measured by the measuring apparatus in accordance with the measurment execution program after the debugging.

REFERENCES:
patent: 3931506 (1976-01-01), Borrelli et al.
patent: 4550406 (1985-10-01), Neal
patent: 4862399 (1989-08-01), Freeman
patent: 4977531 (1990-12-01), Ogata et al.

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