Method of measuring dielectric constant of PCB for RIMM

Details Method of measuring dielectric constant of PCB for RIMM Method of measuring dielectric constant of PCB for RIMM

2005-04-19

2005-04-19

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Distributive type parameters

C324S533000, C324S534000, C324S535000, C324S639000, C324S646000

Reexamination Certificate

active

06882161

ABSTRACT:
Disclosed herein is a method of measuring a dielectric constant of a Printed Circuit Board (PCB) for a Rambus Inline Memory Module (RIMM), which includes the steps of measuring a length of a Rambus product of a PCB, applying an input waveform to the Rambus product at a certain probing position and obtaining a cross point of rising times of the input waveform and an output waveform generated by reflection of the input waveform, obtaining time corresponding to the cross point, and calculating a dielectric constant by substituting the measured length of the Rambus product and the obtained time for corresponding variables of a dielectric constant calculating equation.

REFERENCES:
patent: 5548483 (1996-08-01), Feldman
patent: 5877631 (1999-03-01), Takahashi
patent: 6484299 (2002-11-01), Larsen
patent: 6556306 (2003-04-01), Jiang et al.
patent: 6670816 (2003-12-01), Kim et al.
patent: 6759853 (2004-07-01), Butler
patent: 1019980062554 (2000-07-01), None
patent: 1020000085164 (2002-07-01), None

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