Method of measuring delay time and random pulse train generating

Details Method of measuring delay time and random pulse train generating Method of measuring delay time and random pulse train generating

1996-12-09

1999-08-24

Ballato, Josie

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

324614, G01R 2728

Patent

active

059429020

ABSTRACT:
A delay time of a delay time generating circuit which delays an inputted pulse signal for a predetermined time and outputs the delayed pulse signal is measured. A random pulse generating circuit for outputting a train of pulses at random intervals is provided, and an output signal of the delay time generating circuit is applied to an input signal thereof through a positive feedback loop. An output signal is applied from the random pulse generating circuit to the positive feedback loop to cause the positive feedback loop to oscillate, and a delay time of the delay time generating circuit is determined from a period at which the positive feedback loop oscillates. The delay time can accurately be measured without being affected by an interference caused by another signal or a disturbance brought about by noise.

REFERENCES:
patent: 3622905 (1971-11-01), Brown
patent: 3648080 (1972-03-01), Nakaya
patent: 3758873 (1973-09-01), Miller
patent: 3866128 (1975-02-01), Fletcher
patent: 4805021 (1989-02-01), Harlos
patent: 4814689 (1989-03-01), Obara
patent: 5216301 (1993-06-01), Gleeson

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