Method of measuring chiral parameters of a chiral material

Details Method of measuring chiral parameters of a chiral material Method of measuring chiral parameters of a chiral material

1989-06-06

1991-11-05

Wimer, Michael C.

Communications: radio wave antennas

Antennas

Measuring signal energy

324631, G01R 2980

Patent

active

050633910

ABSTRACT:
Methods of measuring chiral parameters of chiral materials with chiral antennas are provided. These methods involve the use of parallel electric and magnetic dipoles to construct a point sensor in conjunction with the use of a turnstyle antenna as a source. By exciting the chiral medium with the turnstyle antenna, both the absolute degree of chirality and the handedness of the chiral medium can be measured by varying the output currents of the point sensor until a null is achieved. This condition indictes that the ratio p/m, where p is the magnitude of the electric dipole moment and m is the magnitude of the magnetic dipole moment, of the point sensor is .+-.i/v.sub.c. From this relation and knowledge of the relation of permittivity and permeability, the absolute value of the chiral admittance and the chirality factor of the medium can also be found.

REFERENCES:
patent: 3951904 (1976-04-01), Tomonaga
patent: 3972049 (1976-07-01), Kaloi
patent: 4307404 (1981-12-01), Young
patent: 4452727 (1984-06-01), Frommer et al.
patent: 4456548 (1984-06-01), Lewis et al.
patent: 4616067 (1986-10-01), Lee et al.
patent: 4678616 (1987-07-01), Tzeng
patent: 4701765 (1987-10-01), Arduini
patent: 4809011 (1989-02-01), Kunz
patent: 4948922 (1990-08-01), Varadan et al.
Arnaud, J. A. et al., Resonant-Grid Quasioptical Diplexer, Electronic Letters, vol. 9, No. 25, Dec. 1973.
R. B. Kaner et al., "Plastics That Conduct Electricity," Scientific American (Feb. 1988).
A. Lakhtakia et al., "Scattering and Absorption Characteristics of Lossy Dielectric, Chiral, Non-Spherical Objects," Applied Optics, vol. 24, No. 23 (Dec. 1, 1985).
A. Lakhtakia et al., "A Parametric Study of Microwave Reflection Characteristics of a Planar Achiral-Chiral Interface," IEEE Transactions on Electromagnetic Compatibility, vol. EMC-28, No. 2 (May 1986).
Varadan et al., "On the Possibility of Designing Antireflection Coatings Using Chiral Composites," Journal of Wave Material Interaction, vol. 2, No. 1 (Jan. 1987), pp. 71-81.
Chirosourb.TM. As an Invisible Medium, Jaggard et al., Electronics Letters, vol. 25, No. 3, pp. 173-174, 2/2/89.
D. L. Jaggard et al., Applied Physics, 18, 1979, pp. 211-215.
S. Bassiri et al., Alta Frequenza, 2, 1986, pp. 83-88.
N. Engheta et al., IEEE Trans. on Ant. & Propag., 37, 4, 1989, pp. 512-515.
S. Bassiri et al., J. Opt. Soc. Am. A5, 1988, pp. 1450-1459.
N. Engheta and P. Pelet, "Modes in Chirowaveguides," Optics Letters, vol. 14, No. 11 (Jun. 1, 1989).

Affiliated with

Also associated with

Rating

Method of measuring chiral parameters of a chiral material does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of measuring chiral parameters of a chiral material, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of measuring chiral parameters of a chiral material will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-501108