Optics: measuring and testing – By polarized light examination – With polariscopes
Patent
1987-09-25
1989-07-25
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With polariscopes
356426, G01N 2123
Patent
active
048507105
ABSTRACT:
Disclosed is a method of measuring and displaying double refraction. In this method measuring light which has been subjected to double refraction passes through the material to be measured at a point of measurement thereof. A surface of the material to be measured is disposed in a manner that the same is located at right angles, or is inclined with respect to an optical axis of the measuring light. The material is rotated about the point of measurement thereof on a plane which is perpendicular to the optical axis of the measuring light. The data on the double refraction is displayed together with a plus or minus sign thereof as a function of the angle of rotation, in the form of polar coordinates corresponding to the angle of rotation.
REFERENCES:
patent: 4309110 (1982-01-01), Tumerman
Kiyomoto Naoshi
Mochida Yoshihiro
Shirahama Ichiro
Sugimoto Takeyuki
Evans F. L.
ORC Manufacturing Co. Ltd.
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