Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1995-10-27
1998-11-03
Font, Frank G.
Optics: measuring and testing
By polarized light examination
With light attenuation
G01B 1114
Patent
active
058317341
ABSTRACT:
In a method for measuring a reference position of a tool relative to a workpiece, the tool is fastened to a first holder of a machine tool. The workpiece is to be manufactured using the tool and is fastened to a second holder of the machine tool. The tool provides a distinguishing mark on the workpiece in a predetermined reference position of the first holder relative to the second holder. Subsequently, the distinguishing mark is detected by a sensor. Therefore, the reference position of the tool relative to the workpiece is determined from a position of the first holder relative to the second holder. The tool and the sensor are fastened in fixed, permanent positions relative to one another and relative to the first holder. The accuracy of measurement of the position of the tool depends exclusively on the accuracy of positioning of the first holder relative to the second holder. The accuracy of machining the workpiece is not hurt by the accuracy of measurement of the reference position of the tool relative to the workpiece. The sensor may be optical, with a focusing error detector. The second holder may be rotatable about a Z-axis, with the first holder being displaceable parallel to an X-axis which is perpendicular to the Z-axis, and the distinguishing mark being a circular groove in a surface of the workpiece which extends perpendicularly to the Z-axis.
REFERENCES:
patent: 4123695 (1978-10-01), Hale et al.
patent: 4645993 (1987-02-01), Naito et al.
patent: 4803372 (1989-02-01), Hirata et al.
patent: 4884889 (1989-12-01), Beckwith, Jr.
patent: 4892407 (1990-01-01), McMurtry et al.
patent: 4916293 (1990-04-01), Cartlidge et al.
patent: 4950079 (1990-08-01), McMurtry et al.
patent: 5005978 (1991-04-01), Skunes et al.
patent: 5091861 (1992-02-01), Geller et al.
patent: 5392122 (1995-02-01), Ulanov et al.
patent: 5532815 (1996-07-01), Kipman et al.
"An Ultra-Precision Machining Method or the Workpiece-Referred Form Accuracy Control System", by T. Kohno et al, The International Conf. on Advanced Mechatronics, pp. 143-146, May 1989.
Van Gool Gerrit H.
Van Leest Johannes H.F.M.
Van Tooren Arie
Wijn Johan C.
Barschall Anne E.
Font Frank G.
Stafira Michael P.
U.S. Philips Corporation
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