Method of measuring a physical function using a composite...

Optics: measuring and testing – For light transmission or absorption

Reexamination Certificate

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C359S359000

Reexamination Certificate

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11747177

ABSTRACT:
A method for measuring a physical function forms a symmetric composite function by combining the physical function with a reference function. The method obtains a Fourier transform of the symmetric composite function. The method calculates an inverse Fourier transform of the obtained Fourier transform, wherein the calculated inverse Fourier transform provides information regarding the physical function. The physical function can be a nonlinearity profile of a sample with at least one sample surface. The physical function can alternatively by a sample temporal waveform of a sample optical pulse.

REFERENCES:
patent: 3880630 (1975-04-01), Izawa
patent: 4674824 (1987-06-01), Goodman et al.
patent: 4778236 (1988-10-01), Miyawaki
patent: 4792230 (1988-12-01), Naganuma et al.
patent: 4985178 (1991-01-01), Tam
patent: 5053696 (1991-10-01), Williamson et al.
patent: 5071249 (1991-12-01), Takahashi et al.
patent: 5086239 (1992-02-01), Wang
patent: 5194918 (1993-03-01), Kino et al.
patent: 5220451 (1993-06-01), Gotoh et al.
patent: 5239407 (1993-08-01), Brueck et al.
patent: 5247601 (1993-09-01), Myers et al.
patent: 5262890 (1993-11-01), Berkovic et al.
patent: 5309532 (1994-05-01), Chang et al.
patent: 5317147 (1994-05-01), Dandliker et al.
patent: 5368782 (1994-11-01), Gotoh et al.
patent: 5420717 (1995-05-01), Tabata
patent: 5434699 (1995-07-01), Berkovic et al.
patent: 5481636 (1996-01-01), Fukude et al.
patent: 5523840 (1996-06-01), Nishizawa et al.
patent: 5530544 (1996-06-01), Trebino et al.
patent: 5615041 (1997-03-01), Field et al.
patent: 5737116 (1998-04-01), Kadowaki et al.
patent: 5986798 (1999-11-01), Karlsson et al.
patent: 6043884 (2000-03-01), Curbelo
patent: 6456380 (2002-09-01), Naganuma
patent: 6479822 (2002-11-01), Nelson et al.
patent: 6650466 (2003-11-01), Wise et al.
patent: 6728273 (2004-04-01), Perry
patent: 6856393 (2005-02-01), Ozcan et al.
patent: 7050169 (2006-05-01), Ozcan et al.
patent: 7133134 (2006-11-01), Ozcan et al.
patent: 7236247 (2007-06-01), Ozcan et al.
patent: 2004/0036880 (2004-02-01), Ozcan et al.
patent: 2004/0044714 (2004-03-01), Ozcan et al.
patent: 2004/0133614 (2004-07-01), Ozcan et al.
patent: 2000 329618 (2000-11-01), None
patent: 2001 083015 (2001-03-01), None
Alley, Thomas G., et al., Space charge dynamics in thermally poled fused silica,Journal of Non-Crystalline Solids, vol. 242, 1998, pp. 165-176.
Bonfrate, G., et al., Parametric fluorescence in periodically poled silica fibers,Applied Physics Letters, vol. 75, No. 16, Oct. 18, 1999, pp. 2356-2358.
Faccio, D., et al., Dynamics of the second-order nonlinearity in thermally poled silica glass,Applied Physics Letters, vol. 79, No. 17, Oct. 22, 2001, pp. 2687-2689.
Ferreira, Paulo Jorge S.G., Interpolation and the Discrete Papoulis-Gerchberg Algorithm,IEEE Transactions On Signal Processing, vol. 42, No. 10, Oct. 1994, pp. 2596-2606.
PCT/US 03/26311 Invitation to Pay, Aug. 21, 2003, The Board of Trustees of the Leland Stanford Junior University.
PCT/US03/26311 ISR dated Jun. 3, 2004, Aug. 21, 2003, The Board of Trustees of the Leland Stanford Junior University.
PCT/US2004/039320 ISR & Written Opinion dated Jun. 16, 2005, Jun. 29, 2005, The Board of Trustees of the Leland Stanford Junior University.
Fienup, J.R., “Reconstruction of an object from the modulus of its Fourier transform,”Optics Letters, vol. 3, No. 1, Jul. 1978, pp. 27-29.
Fienup, J.R., “Phase retrieval algorithms: a comparison,”Applied Optics, vol. 21, No. 15, Aug. 1, 1982, pp. 2758-2769.
Fisher, Robert A., et al., Transient analysis of Kerr-like phase conjugators using frequency-domain techniques,Physical Review A, vol. 23, No. 6, Jun. 1981, pp. 3071-3083.
Kashyap, Raman, et al., Phase-matched second harmonic generation by periodic poling of fused silica,Applied Physics Letters, vol. 64, No. 11, Mar. 14, 1994, pp. 1332-1334.
Kazansky, P.G., et al., Thermally poled silica glass: Laser induced pressure pulse probe of charge distribution,Applied Physics Letters, vol. 68, No. 2, Jan. 8, 1996, pp. 269-271.
Liu, Alice C., et al., Advances in the measurement of the poled silica nonlinear profile,SPIE, vol. 3542, Nov. 1998, pp. 115-119.
Maker, P.D., et al.,Effects of Dispersion and Focusing on the Production of Optical Harmonics, Physical Review Letters, vol. 8, No. 1, Jan. 1, 1962, pp. 21-22.
Millane, R.P., Analytic Properties of the Hartley Transform and their Implications,Proceedings of the IEEE, vol. 82, No. 3, Mar. 1994, pp. 413-428.
Miller, D.A.B., Time reversal of optical pulses by four-wave mixing,Optics Letters, vol. 5, No. 7, Jul. 1980, pp. 300-302.
Myers, R.A., et al., Large second-order nonlinearity in poled fused silica,Optics Letters, vol. 16, No. 22, Nov. 15, 1991, pp. 1732-1734.
Nakajima, N., Reconstruction of a real function from its Hartley-transform intensity,J. Opt. Soc. Am. A., vol. 5, No. 6, Jun. 1988, pp. 858-863.
Ozcan, A., et al.,A simple post-processing technique to improve the retrieval accuracy of second-order nonlinearity profiles, Edward L. Ginzton Laboratory: Stanford University, Stanford, California 94305; © 2004 Optical Society of America, 2 pages.
Ozcan, A., et al., Cylinder-assisted Maker-fringe Technique,Electronics Letters, vol. 39, No. 25, Dec. 11, 2003, 2 pages.
Ozcan, A., et al.,Improved Fourier transform technique to determine second-order optical nonlinearity profiles, Edward L. Ginzton Laboratory: Stanford University, Stanford, California 94305; © 2003 Optical Society of America, 3 pages.
Ozcan, A., et al., Improved technique to determine second-order optical nonlinearity profiles using two different samples,Applied Physics Letters, vol. 84, No. 5, Feb. 2, 2004, pp. 681-683.
Ozcan, A., et al., Inverse Fourier transform technique to determine second-order optical nonlinearity spatial profiles,Applied Physics Letters, vol. 82, No. 9, Mar. 3, 2003, pp. 1362-1364.
Ozcan, A., et al., Erratum: Inverse Fourier transform technique to determine second-order optical nonlinearity spatial profiles,Applied Physics Letters, vol. 83, No. 8, Aug. 25, 2003, p. 1679.
Ozcan, A., et al.,Post-processing of the second-order optical nonlinearity profile of thin films, Edward L. Ginzton Laboratory: Stanford University, Stanford, California 94305; © 2004 Optical Society of America, 2 pages.
Ozcan, A., et al., Simplified inverse Fourier transform technique to determine second-order optical nonlinearity profiles using a reference sample,Electronics Letters, vol. 40, No. 9, Apr. 29, 2004, 2 pages.
Peri, David, “Optical implementation of a phase retrieval algorithm,”Applied Optics, vol. 26, No. 9, May 1, 1987, pp. 1782-1785.
Pureur, D., et al., Absolute measurement of the second-order nonlinearity profile in poled silica,Optics Letters, vol. 23, No. 8, Apr. 15, 1998, pp. 588-590.
Quatieri, Thomas F., Jr., et al., Iterative techniques for minimum phase signal reconstruction from phase or magnitude,IEEE Trans. Acoust. Speech, Signal Processing, vol. 29, 1981, pp. 1187-1193.
Qui, Mingxin, et al., Double fitting of Maker fringes to characterize near-surface and bulk second-order nonlinearities in poled silica,Applied Physics Letters, vol. 76, No. 23, Jun. 5, 2000, pp. 3346-3348.
Qui, Mingxin, et al., Erratum: “Double fitting of Marker fringes to characterize near-surface and bulk second-order nonlinearities in poled silica,”Applied Physics Letters, vol. 77, No. 23, Dec. 4, 2000, p. 3863.
Quiquempois, Y., et al., Localisation of the induced second-order non-linearity within Infrasil and Suprasil thermally poled glasses,Optics Communications, vol. 176, Apr. 1, 2000, pp. 479-487.
Rosenthal, Amir, et al., Inverse Scattering Algorithm for Reconstructing Strongly Reflecting Fiber Bragg Gratings,IEEE Journal of Quantum Electronics, vol. 39, No. 8, Aug. 2003, pp. 1018-1026.
Sun, P.C., et al., Femtosecond pulse imaging: ultrafast optical oscilloscope,J. Opt. Soc. Am. A, vol. 14, No. 5, May 1997, pp. 1159-1170.
Watanabe, Shigeki, et al., Compensation of Chromatic Dispersion in a Single-Mode Fiber by Optical Phase Conjugation,IEEE Photonics Technology Let

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