Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1984-10-29
1987-10-06
Rosenberger, R. A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356442, G01N 2100
Patent
active
046979255
ABSTRACT:
The test solution in the measuring cell is regarded to be divided into a plurality of sections, and the quantity of scattered light from each section is continuously measured to give a plurality of independent series of signal. This measurement is carried out by scanning the measuring cell with a minute light flux periodically to obtain a plurality of measurements in a period. Out of the series of signals obtained, those containing abnormal scattered light signal are eliminated to determine accurate concentration and reaction process.
REFERENCES:
patent: 3200700 (1965-08-01), Topol
patent: 3279305 (1966-10-01), Muta et al.
patent: 3354772 (1967-11-01), Topol
patent: 4058736 (1977-11-01), Takahashi et al.
patent: 4283143 (1981-08-01), Patterson
patent: 4329591 (1982-05-01), Fujiwara et al.
patent: 4452759 (1984-06-01), Takekawa
patent: 4558947 (1985-12-01), Wardlaw
Hyodo Hiroshi
Iwase Kenichi
Kishimoto Shin-ichi
Yamada Naoki
Kabushiki Kaisha Kyoto Daiichi Kagaku
Rosenberger R. A.
LandOfFree
Method of measurement using scattered light does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of measurement using scattered light, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of measurement using scattered light will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2114632