Method of marking semiconductor chips and markable semiconductor

Details Method of marking semiconductor chips and markable semiconductor Method of marking semiconductor chips and markable semiconductor

1982-05-24

1990-08-07

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

357 65, G01R 3100, H01L 2348

Patent

active

049471147

ABSTRACT:
Method of marking semiconductor chips to indicate at least one definite feature by applying optically recognizable markings to the surface of the semiconductor chips, which includes forming at least one area of the chip provided for marking purposes from a homogeneous and highly reflective material, and applying the optically recognizable markings by changing the surface of the at least one area of the chip provided for making purposes, and a chip which is markable according to the method.

REFERENCES:
patent: 4219827 (1980-08-01), Kaiser

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