Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-01-08
2008-01-08
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C381S092000, C702S077000, C704S241000
Reexamination Certificate
active
11102409
ABSTRACT:
A method for mapping a spectrum obtained from signals under test corresponding to linearly spaced frequencies to logarithmically spaced frequencies in a measuring apparatus. A spectrum within a predetermined frequency range from logarithmically spaced frequencies is selected from this spectrum corresponding to linearly spaced frequencies and vector averaging of the selected spectrum is performed.
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Ninomiya Kazuhiko
Yanagimoto Yoshiyuki
Agilent Technologie,s Inc.
Bobys Marc
Bui Bryan
Le John
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