Method of manufacturing SOI wafer

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates

Reexamination Certificate

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Details

C438S459000, C206S710000, C206S711000, C206S712000, C414S938000

Reexamination Certificate

active

06844242

ABSTRACT:
A boat (4) has a recess (5) for supporting a laminated wafer (50). The recess (5) has a first side surface (5a), a first bottom surface (5b), a second side surface (5c), a second bottom surface (5d) and a third side surface (5e). Viewing from an upper surface of the boat (4), the second bottom surface (5d) is located in a position lower than the first bottom surface (5b). The laminated wafer (50) is mounted on the boat (4) in the state that a side surface of a first silicon wafer (1) is not in contact with the second bottom surface (5d) of the recess (5) and a side surface of a second silicon wafer (2) is in contact with the first bottom surface (5b) of the recess (5). A second main surface (2a) of the second silicon wafer (2) is in contact with the first side surface (5a) of the recess (5) and a second main surface (1a) of the first silicon wafer (1) is in contact with the third side surface (5e) of the recess (5).

REFERENCES:
patent: 4752180 (1988-06-01), Yoshikawa
patent: 4854986 (1989-08-01), Raby
patent: 5306370 (1994-04-01), Herko et al.
patent: 5314107 (1994-05-01), d'Aragona et al.
patent: 5665631 (1997-09-01), Lee et al.
patent: 5725101 (1998-03-01), Kakizaki et al.
patent: 6383890 (2002-05-01), Takisawa et al.
patent: 9-246506 (1997-09-01), None
patent: 2000-294526 (2000-10-01), None

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